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A particle-image based wave profile measurement technique

✍ Scribed by M. A. Mukto; M. A. Atmane; M. R. Loewen

Publisher: Springer
Year: 2006
Tongue: English
Weight: 389 KB
Volume: 42
Category: Article
ISSN: 0723-4864
DOI: 10.1007/s00348-006-0226-6

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