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A Parallel Test Pattern Generation Algorithm to Meet Multiple Quality Objectives

✍ Scribed by Kuan-Yu Liao; Chia-Yuan Chang; Li, J.C.-M.

Book ID: 114607600
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 217 KB
Volume: 30
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2011.2157693

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