A Parallel Approach Eliminates Measurement Perturbations in RLC Circuits

✍ Scribed by Selim G. Akl; Weiguang Yao

• Book ID: 106539292
• Publisher: Springer US
• Year: 2006
• Tongue: English
• Weight: 151 KB
• Volume: 35
• Category: Article
• ISSN: 0920-8542
• DOI: 10.1007/s11227-006-2742-9