✦ LIBER ✦
A Novel Trapping/Detrapping Model for Defect Profiling in High- Materials Using the Two-Pulse Capacitance–Voltage Technique
✍ Scribed by Aguado, D.R.; Govoreanu, B.; Zhang, W.D.; Jurczak, M.; De Meyer, K.; Van Houdt, J.
- Book ID
- 114620148
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 874 KB
- Volume
- 57
- Category
- Article
- ISSN
- 0018-9383
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