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A novel technique to measure the contact resistance of a MOSFET

✍ Scribed by Ng, K.K.

Book ID: 114595914
Publisher: IEEE
Year: 1987
Tongue: English
Weight: 466 KB
Volume: 34
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1987.22961

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