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A novel technique to measure the contact resistance of a MOSFET

โœ Scribed by Ng, K.K.


Book ID
114595914
Publisher
IEEE
Year
1987
Tongue
English
Weight
466 KB
Volume
34
Category
Article
ISSN
0018-9383

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๐Ÿ“œ SIMILAR VOLUMES


Contact resistance as a measure of the s
โœ M. K. Chien; David E. Farrell ๐Ÿ“‚ Article ๐Ÿ“… 1975 ๐Ÿ› Springer US ๐ŸŒ English โš– 266 KB

We have shown experimentally that the electrical contact resistance between a thin copper wire and a bulk superconductor contains a small contribution that varies with temperature below T c. The observed temperature dependence is always close to that of the energy gap in the superconductor.