A novel technique for the simultaneous measurement of ambipolar carrier lifetime and diffusion coefficient in silicon : Mats Roslinget al. Solid-State Electronics35(9), 1223 (1992)

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 115 KB
• Volume: 33
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(93)90220-s