✦ LIBER ✦
A Novel Statistical Timing and Leakage Power Characterization of Partially Depleted Silicon-on-Insulator Gates
✍ Scribed by Kyung Ki Kim; Yong-Bin Kim; Lombardi, F.
- Book ID
- 114630909
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 900 KB
- Volume
- 58
- Category
- Article
- ISSN
- 0018-9456
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