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A novel overlay process for imprint lithography using load release and alignment error pre-compensation method

✍ Scribed by Jinyou Shao; Yucheng Ding; Yiping Tang; Hongzhong Liu; Bingheng Lu; Dongyin Cui


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
516 KB
Volume
85
Category
Article
ISSN
0167-9317

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