✦ LIBER ✦
A novel optical diagnostic technique for analyzing the recrystallization characteristics of polycrystalline silicon thin films following frontside and backside excimer laser irradiation
✍ Scribed by Chil-Chyuan Kuo
- Book ID
- 113831647
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 962 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0143-8166
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