✦ LIBER ✦
A novel methodology for sensing the breakdown location and its application to the reliability study of ultrathin Hf-silicate gate dielectrics
✍ Scribed by Crupi, F.; Kauerauf, T.; Degraeve, R.; Pantisano, L.; Groeseneken, G.
- Book ID
- 114617907
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 526 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0018-9383
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