A Novel Method of Analytical Transmission Electron Microscopy for Measuring Highly Accurately Segregation to Special Grain Boundaries or Planar Interfaces

✍ Scribed by Walther, Thomas ;Rečnik, Aleksander ;Daneu, Nina

• Book ID: 106196736
• Publisher: Springer-Verlag
• Year: 2006
• Weight: 198 KB
• Volume: 155
• Category: Article
• ISSN: 0344-838X
• DOI: 10.1007/s00604-006-0562-5