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A novel method for determining Young’s modulus of thin films by micro-strain gauges

✍ Scribed by Chi Hsiang Pan

Publisher: Springer-Verlag
Year: 2005
Tongue: English
Weight: 372 KB
Volume: 11
Category: Article
ISSN: 0946-7076
DOI: 10.1007/s00542-004-0469-1

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