𝔖 Bobbio Scriptorium
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A novel MD/FE coupled model for numerical investigation of interfacial thermal resistance in MEMS/NEMS packaging

✍ Scribed by Yang, Ping; Liao, Ningbo


Book ID
115480715
Publisher
Taylor and Francis Group
Year
2008
Tongue
English
Weight
877 KB
Volume
15
Category
Article
ISSN
0927-6440

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