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A novel approach to resistivity and interconnect modeling

✍ Scribed by Y. Travaly; M. Bamal; L. Carbonell; F. Iacopi; M. Stucchi; M. Van Hove; G.P. Beyer

Book ID: 108207680
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 267 KB
Volume: 83
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2006.10.048

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