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A Novel Approach to Perform Gate-Level Yield Analysis and Optimization Considering Correlated Variations in Power and Performance

โœ Scribed by Srivastava, A.; Chopra, K.; Shah, S.; Sylvester, D.; Blaauw, D.


Book ID
117907958
Publisher
IEEE
Year
2008
Tongue
English
Weight
703 KB
Volume
27
Category
Article
ISSN
0278-0070

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