A Novel Approach to Perform Gate-Level Yield Analysis and Optimization Considering Correlated Variations in Power and Performance

✍ Scribed by Srivastava, A.; Chopra, K.; Shah, S.; Sylvester, D.; Blaauw, D.

• Book ID: 117907958
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 703 KB
• Volume: 27
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2007.907227