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A nonlinear method to estimate model parameters of junction field-effect transistors: H. Ikeda, M. Huai-Jian, H. Yamamoto (Dept. of Electron. Engl., Chiba Univ., Japan) IEEE Trans. Instrum. & Meas (USA) vol. IM-35, no. 3, pp. 272-7 (Sept. 1986)


Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
98 KB
Volume
18
Category
Article
ISSN
0026-2692

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