A method for non-destructive resistivity
โ
L. Bardelli; G. Poggi; G. Pasquali; M. Bini
๐
Article
๐
2009
๐
Elsevier Science
๐
English
โ 625 KB
It is well known that the resistivity non-uniformity of silicon detectors is a crucial parameter when pulse-shape analysis is used to identify the charge and the mass of stopped heavy ions. In this work a method is described that allows a direct absolute resistivity measurement of the detector as a