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A non-destructive method for mapping formation damage

โœ Scribed by M.A. Khan; S.Z. Jilani; H. Menouar; A.A. Al-Majed


Book ID
104263428
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
259 KB
Volume
39
Category
Article
ISSN
0041-624X

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A method for non-destructive resistivity
โœ L. Bardelli; G. Poggi; G. Pasquali; M. Bini ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 625 KB

It is well known that the resistivity non-uniformity of silicon detectors is a crucial parameter when pulse-shape analysis is used to identify the charge and the mass of stopped heavy ions. In this work a method is described that allows a direct absolute resistivity measurement of the detector as a