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A new write/erase method to improve the read disturb characteristics based on the decay phenomena of stress leakage current for flash memories
✍ Scribed by Endoh, T.; Shimizu, K.; Iizuka, H.; Masuoka, F.
- Book ID
- 114537162
- Publisher
- IEEE
- Year
- 1998
- Tongue
- English
- Weight
- 128 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0018-9383
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