✦ LIBER ✦
A new wafer level reliability method for evaluation of ionic induced pmosfet drift effects
✍ Scribed by A. Dreizner; J. Nagel; R. Scharfe
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 243 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0026-2714
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