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A new technology for manufacturing the dielectric isolation of elements of microelectronic devices by oxidizing grooves in single-crystal silicon

✍ Scribed by Yu. P. Snitovskii; M. G. Krasikov


Book ID
110214425
Publisher
Springer
Year
2010
Tongue
English
Weight
305 KB
Volume
39
Category
Article
ISSN
1063-7397

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