A new technique to determine the average low-field electron mobility in MESFET using C-V measurement

✍ Scribed by Moon, B.-J.; Helix, M.J.; Lee, S.

• Book ID: 114534707
• Publisher: IEEE
• Year: 1992
• Tongue: English
• Weight: 463 KB
• Volume: 39
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.155868