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A new technique for measuring temporal profiles of picosecond and femtosecond laser pulses using self-induced deflection in a semiconductor wedge

✍ Scribed by Ma, R.-L. ;Yu, P. Y.


Publisher
John Wiley and Sons
Year
1985
Tongue
English
Weight
323 KB
Volume
90
Category
Article
ISSN
0031-8965

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