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A new technique for imaging the logic state of passivated conductors: biased resistive contrast imaging : Edward I. Cole Jr. 28th A. Proc. Reliab. Phys. Symp. (IEEE), 45 (March 1990)


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
131 KB
Volume
31
Category
Article
ISSN
0026-2714

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