✦ LIBER ✦
A new technique for hot carrier reliability evaluations of flash memory cell after long-term program/erase cycles
✍ Scribed by Chung, S.S.; Cherng-Ming Yih; Shui-Ming Cheng; Mong-Song Liang
- Book ID
- 114537879
- Publisher
- IEEE
- Year
- 1999
- Tongue
- English
- Weight
- 226 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0018-9383
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