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A new technique for directly probing the intrinsic tristability and its temperature dependence in a resonant tunneling diode

✍ Scribed by M.L.F. Lerch; A.D. Martin; P.E. Simmonds; L. Eaves; M.L. Leadbeater


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
367 KB
Volume
37
Category
Article
ISSN
0038-1101

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