A new stable core structure of 60° shuffle dislocation in silicon and associated mobility behavior
✍ Scribed by Kangyou Zhong; Qingyuan Meng; Wei Zhao
- Book ID
- 104542057
- Publisher
- John Wiley and Sons
- Year
- 2012
- Tongue
- English
- Weight
- 343 KB
- Volume
- 249
- Category
- Article
- ISSN
- 0370-1972
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✦ Synopsis
Abstract
We performed density‐functional theory simulations and obtained a new stable reconfiguration of shuffle 60° dislocation in silicon. The configuration is characterized by a complex of a shuffle 60° dislocation and an additional bond defect. Its mobility is discussed by determining the critical shear strain for dislocation glide. The critical shear strain is 10.6% without thermal activation, and decreases to 7.9% at a temperature ranging from 100 to 600 K. It can take part in the process of plastic deformation by emitting a common glissile shuffle 60° dislocation under high stress at low temperature.