✦ LIBER ✦
A New SPICE Reliability Simulation Method for Deep Submicrometer CMOS VLSI Circuits
✍ Scribed by Li, X.; Qin, J.; Huang, B.; Zhang, X.; Bernstein, J.B.
- Book ID
- 120321383
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 385 KB
- Volume
- 6
- Category
- Article
- ISSN
- 1530-4388
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