✦ LIBER ✦
A new soft-error phenomenon in VLSIs The alpha-particle-induced source/drain penetration (ALPEN) effect : Eiji Takeda, Dai Hisamoto and Tohru Toyabe. Proc. IEEE/IRPS, 109 (1988)
- Book ID
- 103285763
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 123 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0026-2714
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