✦ LIBER ✦
A new soft breakdown model for thin thermal SiO2 films under constant current stress
✍ Scribed by Tomita, T.; Utsunomiya, H.; Sakura, T.; Kamakura, Y.; Taniguchi, K.
- Book ID
- 114537531
- Publisher
- IEEE
- Year
- 1999
- Tongue
- English
- Weight
- 190 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0018-9383
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