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A new rule-based clustering technique for defect analysis

✍ Scribed by N.G. Shankar; Z.W. Zhong

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 347 KB
Volume: 36
Category: Article
ISSN: 0026-2692
DOI: 10.1016/j.mejo.2005.02.120

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