A new rapid technique for characterizing microstructures of films produced by ion beams in the transmission electron microscope

✍ Scribed by W.S. Sampath; P.J. Wilbur

• Publisher: Elsevier Science
• Year: 1987
• Weight: 721 KB
• Volume: 90
• Category: Article
• ISSN: 0025-5416
• DOI: 10.1016/0025-5416(87)90234-5