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A new property of Stein procedure in measurement error model

✍ Scribed by Anil K. Srivastava; Shalabh


Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
215 KB
Volume
32
Category
Article
ISSN
0167-7152

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✦ Synopsis


Stein-rule procedure is a known technique for yielding biased but efficient estimators of parameters. This article demonstrates that it can be utilized for overcoming the inconsistency of least squares estimators in measurement error models and therefrom providing a class of consistent estimators.


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