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A New Precision Digital Phase Meter and Its Simple Calibration Method

โœ Scribed by Kawagoe, J.; Kawasaki, T.


Book ID
114631569
Publisher
IEEE
Year
2010
Tongue
English
Weight
226 KB
Volume
59
Category
Article
ISSN
0018-9456

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This paper describes the preparation, measurement and use of microspheres for calibrating individual test sieves. Using a 63 mm sieve as an example, 2.5 million apertures, or 80% of the surface is examined in under 2 minutes. Because of the narrowness of the size distribution, a 5% difference in per