A New Noncontact Method for the Prediction of Both Internal Thermal Resistance and Junction Temperature of White Light-Emitting Diodes

✍ Scribed by Xuehui Tao; Huanting Chen; Si Nan Li; Hui, S.Y.R.

• Book ID: 119820472
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 726 KB
• Volume: 27
• Category: Article
• ISSN: 0885-8993
• DOI: 10.1109/tpel.2011.2169461