✦ LIBER ✦
A new non-destructive analysis of semiconductor heterojunctions with very thin surface layers: An application of soft x-ray spectroscopy to Si-compound (film)/Si (substrate)
✍ Scribed by M. Iwami; M. Kusaka; M. Hirai; H. Nakamura
- Book ID
- 107925702
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 354 KB
- Volume
- 41-42
- Category
- Article
- ISSN
- 0169-4332
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