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A New Method to Measure Small Amounts of Solute Atoms on Planar Defects and Application to Inversion Domain Boundaries in Doped Zinc Oxide

✍ Scribed by T. Walther; N. Daneu; A. Recnik


Book ID
111587404
Publisher
Springer
Year
2004
Tongue
English
Weight
236 KB
Volume
12
Category
Article
ISSN
0927-7056

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