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A new method to investigate separately the properties of screw and edge dislocations in II-VI compound semiconductors

✍ Scribed by Vyvenko, O. F. ;Istratov, A. A.

Publisher: John Wiley and Sons
Year: 1993
Tongue: English
Weight: 410 KB
Volume: 138
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211380243

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