A new method to evaluate the quality of single crystal Cu by an X-ray diffraction butterfly pattern method

✍ Scribed by Zhenming Xu; Zhenqi Guo; Jianguo Li

• Book ID: 113779795
• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 614 KB
• Volume: 53
• Category: Article
• ISSN: 1044-5803
• DOI: 10.1016/j.matchar.2004.09.003