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A New Method of Measuring Reaction-Time and a New Use for It in the Industrial Museum

✍ Scribed by F. C. Brown


Book ID
123624836
Publisher
American Association for the Advancement of Science
Year
1929
Weight
512 KB
Volume
28
Category
Article
ISSN
0096-3771

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Electrostatic discharge failure factor o
✍ Kouichi Suzuki; Tetsuo Muranoi; Manabu Takeuchi πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 276 KB πŸ‘ 2 views

The electrostatic discharge (ESD) sensitivities of highly refined ULSIs should be evaluated by a test method based on the direct-charging charged device model (D-CDM) or the field-induced charged device model (F-CDM). The CDM features nanosecond transient response and high peak current, as compared