A New Method of Measuring Localized Chromatic Dispersion of Structured Nanowaveguide Devices Using White-Light Interferometry

✍ Scribed by Dong Wook Kim; Seung Hwan Kim; Seoung Hun Lee; Kyong Hon Kim; Jong-Moo Lee; El-Hang Lee

• Book ID: 114563503
• Publisher: Optical Society of America
• Year: 2012
• Tongue: English
• Weight: 750 KB
• Volume: 30
• Category: Article
• ISSN: 0733-8724
• DOI: 10.1109/jlt.2011.2177638