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A new method of determining the atom form factor by high-voltage electron diffraction. An application of the effect of vanishing of the second-order reflexion

โœ Scribed by Watanabe, D. ;Uyeda, R. ;Fukuhara, A.


Book ID
114520798
Publisher
International Union of Crystallography
Year
1968
Weight
253 KB
Volume
24
Category
Article
ISSN
0567-7394

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