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A new method of detecting pinholes existing in a-Si:H films

✍ Scribed by Yuichi Sakai; Shinji Yae; Michio Matsumura; Yoshihiro Nakato; Hiroshi Tsubomura

Publisher
Elsevier Science
Year
1988
Weight
810 KB
Volume
17
Category
Article
ISSN
0165-1633

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