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A new method for the determination of the thickness, the optical constants and the relaxation time of weakly absorbing semiconducting thin films

โœ Scribed by D.B. Kushev; N.N. Zheleva; Y. Demakopoulou; D. Siapkas


Book ID
107768136
Publisher
Elsevier Science
Year
1986
Weight
659 KB
Volume
26
Category
Article
ISSN
0020-0891

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