๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A New Method for Measuring Breakdown and Maintenance Fields in Microwave Discharges

โœ Scribed by Nachman, Manfred

Book ID
117932252
Publisher
IEEE
Year
1977
Tongue
English
Weight
869 KB
Volume
5
Category
Article
ISSN
0093-3813

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Electrostatic discharge failure factor o
Electrostatic discharge failure factor of LSIs and a new method for measuring it
โœ Kouichi Suzuki; Tetsuo Muranoi; Manabu Takeuchi ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 276 KB ๐Ÿ‘ 2 views

The electrostatic discharge (ESD) sensitivities of highly refined ULSIs should be evaluated by a test method based on the direct-charging charged device model (D-CDM) or the field-induced charged device model (F-CDM). The CDM features nanosecond transient response and high peak current, as compared