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A new method for determining electron beam proximity correction parameters in a double layer siloxane-diazo resist system

✍ Scribed by Jones, Fletcher; Paraszczak, Jurij; Speth, Albert


Book ID
120592855
Publisher
American Institute of Physics
Year
1984
Tongue
English
Weight
833 KB
Volume
55
Category
Article
ISSN
0021-8979

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