A new look at impact ionization-Part II: Gain and noise in short avalanche photodiodes

✍ Scribed by Yuan, P.; Anselm, K.A.; Hu, C.; Nie, H.; Lenox, C.; Holmes, A.L.; Streetman, B.G.; Campbell, J.C.; McIntyre, R.J.

• Book ID: 114537812
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 218 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.777151