✦ LIBER ✦
A New Gate-Charging Protection Strategy for Transistors in Integrated-Circuit Test Chips and Products
✍ Scribed by Lin, W.; Smudski, J.
- Book ID
- 114618967
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 196 KB
- Volume
- 54
- Category
- Article
- ISSN
- 0018-9383
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