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A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor

✍ Scribed by In-Hwan Ji; Min-Woo Ha; Young-Hwan Choi; Seung-Chul Lee; Chong-Man Yun; Min-Koo Han

Book ID: 104051441
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 795 KB
Volume: 39
Category: Article
ISSN: 0026-2692
DOI: 10.1016/j.mejo.2007.11.018

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