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A new extrapolation method for long-term degradation prediction of deep-submicron MOSFETs

✍ Scribed by Zhi Cui; Liou, J.J.; Yue, Y.


Book ID
114617134
Publisher
IEEE
Year
2003
Tongue
English
Weight
262 KB
Volume
50
Category
Article
ISSN
0018-9383

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